Level of Radiological Hazards at the Information Computer Technology (ICT) Complex, Federal University Otuoke, Nigeria

Authors

  • , U.L Anekwe

    Federal University Otuoke
    Author

Keywords:

Adsorbed dose, Background radiation, Electronic equipment, Excess lifetime cancer risk, ICT complex

Abstract

Background ionizing radiation (BIR) is the largest source of human exposure to ionizing radiation and elevated levels of natural radionuclides and their decay products may increase long-term health risks, particularly in high-occupancy environments such as university complexes. This study assessed radiation levels and associated risks in and around the Information Communication Technology (ICT) Complex of Federal University Otuoke, Bayelsa State, Nigeria. Forty (40) sampling points were monitored using portable radiation survey meter, the Alert monitor 200. Results of the study showed that the BIR values ranged from 0.010 to 0.018 mR/h. These BIR values were used to compute corresponding values of absorbed dose rates, and radiological risk parameters such as equivalent dose (ED), annual effective dose equivalent (AEDE), and excess lifetime cancer risk (ELCR). Absorbed dose rates ranged from 87.0 to 156.6 nGy/h with mean value of 113.1 nGy/h. The equivalent dose varied from 0.53 to 0.96 mSv/y, with 0.72 mSv/y mean value. Indoor AEDE values ranged between 0.40 and 0.72 mSv/y (mean: 0.54 mSv/y), while outdoor AEDE ranged from 0.13 to 0.24 mSv/y with mean of 0.18 mSv/y. The estimated ELCR values ranged from 1.0 to 1.8) × 10⁻³ for indoors and 0.33 to 0.60 × 10⁻³ for outdoors, both exceeding the global average of 0.29 × 10⁻³. Generally, these values are not at alert levels though prolonged occupancy of the ICT Complex may therefore pose non-negligible long-term stochastic health risks, continuous monitoring is therefore advised.

  

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Published

2025-09-16

How to Cite

Level of Radiological Hazards at the Information Computer Technology (ICT) Complex, Federal University Otuoke, Nigeria. (2025). Applied Sciences, Computing, and Energy, 3(2), 344-355. https://cemrj.com/index.php/volumes/article/view/113